Material | Au | Solder | Cu | Ni | Electroless Ni/Au |
Function | |||||
---|---|---|---|---|---|---|---|---|---|---|---|
- | +SnAg | +Ni +SnAg or +SnBi |
- | +SnAg | |||||||
Form | PLATE | STUD | PLATE | MOUNT | PLATE | PLATE | PLATE | PLATE | PLATE | PLATE | --- |
Image | --- | ||||||||||
MB50 | ● | ● | - | - | ● | ● | ● | ● | ● | ● | Daisy |
MB80 | - | ● | - | - | ● | ● | ● | ● | ● | ● | Daisy |
AS8R | ● | - | - | - | ● | - | - | - | - | ● | Daisy |
MB130A/MB130B | - | ● | - | - | ● | ● | ● | ● | ● | ● | Daisy |
MB6020 | - | ● | - | - | - | - | - | - | - | ● | Daisy |
CC40/CC40MB | - | - | - | - | ● | ● | ● | ● | ● | ● | Daisy |
IP40 | - | - | - | - | ● | ● | ● | ● | ● | ● | Daisy/Vernier Bump Short/ Breakdown Voltage |
IP40MB | - | - | - | - | - | - | - | - | - | ● | |
IP40A | - | - | - | - | ● | ● | - | - | - | - | |
CC80 | - | ● | - | - | ● | ● | ● | ● | ● | ● | Daisy |
IP80 | - | - | - | - | ● | ● | ● | ● | ● | ● | Daisy |
CC80TSV | - | - | - | - | - | ● | - | - | - | ●/◎ | TSV |
CC80MarkⅣ | - | - | - | - | ● | ● | - | - | - | ● | Daisy |
IP80MarkⅣ | - | - | - | - | - | - | - | - | - | ● | Daisy |
WM40-0101 | - | - | - | - | ◎ | ● | - | - | - | ● | --- |
WM40-0102 | - | - | - | - | - | ● | - | - | - | ● | Daisy |
WM40-0103 | - | - | - | - | - | ● | - | - | - | ● | Daisy |
IPWM40 | - | - | - | - | - | - | - | - | - | ● | Daisy/ Bump Short/ Break Down Voltage |
HBM-T | - | - | - | - | ● | ● | - | - | - | ● | Daisy |
IPHBM | - | - | - | - | - | - | - | - | - | ● | Daisy |
FC150LC | - | - | - | - | ● | ● | - | - | - | ● | Daisy |
FC120 | - | - | - | - | ● | ● | ● | ● | ● | ● | Daisy |
FC150 | - | - | - | ● | ● | ● | ● | ● | ● | ● | Daisy |
FC150SC | - | - | - | ● | ● | ● | ● | ● | ● | ● | Daisy |
FC200 | - | - | - | ● | ● | ● | ● | ● | ● | ● | Daisy |
FC200SC | - | - | - | ● | ● | ● | ● | ● | ● | ● | Daisy |
FBW | - | - | - | - | ● | ● | - | - | - | - | --- |
FBWA | - | - | - | - | ● | ● | - | - | - | - | --- |
WLP | - | - | - | ● | - | - | - | - | - | - | Daisy |
Free Size Cut | - | - | - | ● | - | - | - | - | - | - | Daisy |
ME | - | - | - | - | ● | - | - | - | - | - | Migration |
HPW | - | ● | - | - | ● | ● | ● | ● | ● | ● | Thermal/ Heat Generation |
HPW150FA | - | - | - | - | ● | ● | ● | ● | ● | - | |
HPW300FA | - | - | - | - | ● | ● | ● | ● | ● | - | |
HPW MarkⅡ | - | - | - | - | ● | ● | ● | - | - | ● | Thermal/ Heat Generation/ Insulation Resistance |
LCD30A | ● | - | - | - | - | - | - | - | - | - | Daisy |
PWB8/PWB | - | - | - | - | ● | - | - | - | - | - | Bondability |
ITO1101/1102 | - | - | - | - | - | - | - | - | - | - | Bondability |
Cu Pillar Bump TEG |
Solder Bump TEG |
Electroless Plating Bump TEG |
Specification | Type-A | Type-B |
---|---|---|
Wafer Size | 8 inch | 8 inch |
Wafer Thickness | 725±25μm | 725±25μm |
Chip Size | 7.3mm■ | 7.3mm■ |
Pad Pitch | 50μm | 50μm |
Function | Daisy Chain | Daisy Chain |
Bump Size | - | Au: 30µm■ Cu: 30µm■ Cu: φ25μm● |
Electrode/Height | Au-Stud Bump Wire Bonding |
Cu-Pillar Au-Plated Solder Plated Ni on Cu-Pillar (Cu30μm+SnAg15µm) |
Number of Pad | 544 pads/chip | 544 pads/chip |
Number of Chip | 478 chips/wafer | 478 chips/wafer |
Specification | TYPE-A | TYPE-B |
---|---|---|
Wafer Size | 8 inch | 8 inch |
Wafer Thickness | 725±25μm | 725±25μm |
Chip Size | 7.3mm■ | 7.3mm■ |
Pad Pitch | 80μm Staggerd | 80μm Staggerd |
Function | Daisy Chain | Daisy Chain |
Bump Size | - | 38μm■ |
Electrode | Wire Bonding | Cu Pillar |
Number of Pad | 648 pads/chip 82 pads × 4 (Outer Line) 80 pads × 4 (Innter Line) |
648 pads/chip 82 pads × 4 (Outer Line) 80 pads × 4 (Innter Line) |
Number of Chip | 478 chips/wafer | 478 chips/wafer |
Specification | AS8R |
---|---|
Wafer Size | 8 inch |
Wafer Thickness | 725±25μm |
Chip Size | 3.5 mm■ |
Pad Pitch | 120μm |
Function | Daisy Chain |
Bump Size | - |
Electrode | Wire Bonding Stud Bump Cu Pillar |
Number of Pad | 96 pads/chip (Outer Line) 88 pads/chip (Inner Line) |
Number of Chip | 2266 chips/wafer |
Specification | MB130 | ||
---|---|---|---|
MB130A TYPE-A | MB130A TYPE-B | MB130B | |
Wafer Size | 8 inch | 8 inch | 8 inch |
Wafer Thickness | 725±25μm | 725±25μm | 725±25μm |
Chip Size | 2.13 mm■ | 2.13 mm■ | 2.13 mm■ |
Metal Material | Al-Si-Cu | Al-Si-Cu | Al-Cu |
Pad Pitch | 130μm | 130μm | 130μm |
Function | Daisy Chain | Daisy Chain | Daisy Chain |
Bump Size | - | Φ70µm | - |
Electrode | Wire Bonding Au Stud Bump |
Cu Bump | Wire Bonding Au Stud Bump |
Number of Pad | 108 pads/chip 15 pads× 4 (outer Line) 12 pads× 4 (Inner Line) |
108 pads/chip 15 pads× 4 (outer Line) 12 pads× 4 (Inner Line) |
108 pads/chip 15 pads× 4 (outer Line) 12 pads× 4 (Inner Line) |
Number of Chip | 6060 chips/wafer | 6060 chips/wafer | 6060 chips/wafer |
Specification | MB6020-0102JY |
---|---|
Wafer Size | 8 inch |
Wafer Thickness | 725±25μm |
Chip Size | 3.0 mm■ |
Pad Pitch | 60 / 55 / 50 / 45 / 40 / 35 / 30 / 25 / 20 μm |
Function | Daisy Chain |
Bump Size | - |
Electrode | Wire Bonding |
Number of Pad | (40×4) (40×4) (38×4) (38×4) (36×4) (34×4) (30×4) (26×4) (18×4) |
Number of Chip | 3016 chips/wafer |
Specification | CC40-0101JY |
---|---|
Wafer Size | 8 inch |
Wafer Thickness | 725±25μm |
Chip Size | 7.3 mm■ |
Pad Pitch | Model Ⅰ: 40μm Staggered + 40μm Full Area Model Ⅱ: 40μm Staggered |
Function | Daisy Chain |
Bump Size | Model Ⅰ: 22μm● Model Ⅱ: 22μm● |
Electrode/Height | (Cu15μm+SnAg10μm) |
Number of Pad | Model Ⅰ: 29576 pads/chip Model Ⅱ: 1352 pads/chip |
Number of Chip | 478 chips/wafer |
Evaluation KIT | WALTS-TEG IP40A-0101JY (Silicon Interposer) |
Specification | CC40-0101JY |
---|---|
Wafer Size | 8 inch |
Wafer Thickness | 725±25μm |
Chip Size | 7.3 mm■ |
Pad Pitch | 40μm pitch Full area + Staggerd(Peripheral) |
Function | Daisy Chain |
Bump Size | 10μm● |
Number of Pad | 29576 pads/chip |
Number of Chip | 478 chips/wafer |
Evaluation KIT | WALTS-TEG IP40MB-0101JY (Silicon Interposer) |
Specification | IP40-0101JY(ModelⅠ / ModelⅡ) |
---|---|
Wafer Size | 8 inch |
Wafer Thickness | 725±25μm |
Chip Size | 10.0 mm■ |
Pad Pitch | (1) 40μm pitch Full area + Staggered (Model Ⅰ) 40μm pitch Staggered (Model Ⅱ) (2) 250μm pitch Periphera (Outer Pad) |
Function | Daisy Chain Bump Short Check Vernier Breakdown Voltage Check between the Bumps |
Bump Size | --- |
Electrode | Electoroless Ni/Au plating |
Number of Pad | Model Ⅰ:(1) 29576 pads/chip (2) 124 pads/chip (Outer Pad) Model Ⅱ:(1) 1352 pads/chip (2) 124 pads/chip (Outer Pad) |
Number of Chip | 256 chips/wafer |
Specification | IP40MB-0101JY |
---|---|
Wafer Size | 8 inch |
Wafer Thickness | 725±25μm |
Chip Size | 10.0 mm■ |
Pad Pitch | (1) 40μm pitch Full area (2) 40μm pitch Staggered(Peripheral) (3) 250μm pitch Peripheral (Outer Pad) |
Function | Daisy Chain Bump Short Check Vernier Breakdown Voltage Check between the Bumps |
Bump Size | --- |
Electrode | Electoroless Ni/Au plating |
Number of Pad | (1) 28224 pads(2)1352pads(3)124pads |
Number of Chip | 256 chips/wafer |
Specification | IP40A-0101JY(ModelⅠ) |
---|---|
Wafer Size | 12 inch |
Wafer Thickness | 775±25μm |
Chip Size | 10.0 mm■ |
Pad Pitch | (1) 40μm pitch Full area + Staggered (ModelⅠ) (2) 250μm pitch Periphera (Outer Pad) |
Function | Daisy Chain Bump Short Check Vernier Breakdown Voltage Check between the Bumps |
Bump Size | --- |
Electrode | Electoroless Ni/Au plating |
Number of Pad | Model Ⅰ:(1) 29576 pads/chip (2) 124 pads/chip (Outer Pad) |
Number of Chip | 616 chips/wafer |
Specification | CC80-0101JY |
---|---|
Wafer Size | 8 inch |
Wafer Thickness | 725±25μm |
Chip Size | 7.3 mm■ |
Pad Pitch | 80μm Staggered (Peripheral) 300μm Full Area (Center Core) |
Function | Daisy Chain |
Bump Size | 38µm■ or φ42μm● |
Electrode/ Height | Au-stud Bump Wire Bonding Au Plating Cu Pillar (Cu30μm+SnAg15μm) |
Number of Pad | 1048 pads/chip Peripheral(648) Full Area(400) |
Number of Chip | 478 chips/wafer |
Evaluation KIT | WALTS-TEG IP80-0101JY WALTS-KIT CC80(T)-0106JY |
Specification | IP80-0101JY |
---|---|
Wafer Size | 8 inch |
Wafer Thickness | 725±25μm |
Chip Size | 10.0 mm■ |
Pad Pitch | (1) 80μm Staggered (Inner Pad) (2) 300μm Full Area (Center Core) (3) 250μm Periphera (Outer Pad) |
Function | Daisy Chain |
Bump Size | - |
Electrode | Cu Pillar Electoroless Ni/Au plating |
Number of Pad | (1) 648 pads/chip (2) 400 pads/chip (3) 124 pads/chip |
Number of Chip | 256chips/wafer |
Specification | CC80TSV-2 | ||
---|---|---|---|
Wafer Size | 8 inch | ||
Chip Thickness | 100μm | ||
Chip Size | 7.3 mm■ | ||
Pad Pitch | 80μm Staggered (Periphera) 300μm Full Area (Center Core) |
||
TSV Hole Diameter | φ40µm● | ||
Top Side |
Electrode | Cu+SnAg | |
Bump Size | 38μm■ (Option: φ42μm●) | ||
Bump Height | (Cu20μm+SnAg15μm) | ||
Bottom Side |
Electrode | Electroless Ni/Au | |
Bump Size | φ48μm●(Option: φ42μm●) | ||
Bump Height | (8~12µm) | ||
Number of Chip | 478 chips/wafer | ||
Evaluation KIT | WALTS-TEG CC80-0101JY WALTS-TEG IP80-0101JY (Silicon Interposer) |
Specification | CC80MarkIV-0101JY | ||
---|---|---|---|
Wafer Size | 8inch | ||
Wafer Thickness | 725±25μm | ||
Chip | Chip A | Chip B | |
Chip Size | 6.0 mm × 10.0 mm | 4.0 mm × 10.0 mm | |
Pad Pitch |
① 40μm[10Row]×50μm[192Row] (Peripheral) |
||
Function | Daisy Chain | ||
Electrode/Height | (Cu15μm+SnAg10μm) | ||
Bump Size | φ25μm● | ||
Number of Bump/Pad | ①1920bumps/1920pads ② 687 bumps/ 687 pads ③1743bumps/1743pads |
①1920bumps/1920pads ② 531 bumps/ 531 pads ③ 978 bumps/ 978 pads |
|
Number of Chip | Chip A:228chips/wafer Chip B:228chips/wafer | ||
Evaluation KIT | WALTS-TEG IP80MarkIV-0101JY (Sillicon Interposer) |
Specification | IP80MarkIV-0101JY | ||
---|---|---|---|
Wafer Size | 8inch | ||
Wafer Thickness | 725±25μm | ||
Chip Size | 15.0 mm × 15.0 mm | ||
Pad Pitch |
① 40μm[10Row]×50μm[192Row]×2 (Peripheral) |
||
Function | Daisy Chain | ||
Electrode | Electroless Ni/Au plating | ||
Bump Size | ①27μm● ②27μm● ③27μm● ④141μm■ |
||
Number of Bump/Pad | ①3840bumps/3840pads ②1172bumps/1172pads ③2721bumps/2721pads ④327bumps/329pads |
||
Number of Chip | 97 chips/wafer |
Specification | WM40-0101JY | ||
---|---|---|---|
Wafer Size | 8inch | ||
Wafer Thickness | 50μm | ||
Chip Size | 10 mm × 8 mm | ||
Function | --- | ||
Top Side |
Electrode | Cu Pillar | |
Bump Size | φ20μm● | ||
Electrode | (Cu10μm + SnAg8μm) | ||
Bump Pitch | ① 40μm | ②300μm | |
Number of Bump | ①1200 bumps | ② 714 bumps | |
Bottom Side |
Electrode | Cu Post | |
Bump Size | φ26μm● | ||
Electrode/ Height | Cu Post (Cu 6μm) |
||
Bump Pitch | ① 40μm | ②300μm | |
Number of Bump | ①1200 bumps | ② 714 bumps | |
Number of Chip | 312 chips/wafer | ||
Evaluation KIT | WALTS-KIT CC80MarkII-0201JY |
Specification | WM40-0102JY | ||
---|---|---|---|
Wafer Size | 8inch | ||
Wafer Thickness | 725±25μm | ||
Chip Size | 10 mm × 8 mm | ||
Function | Daisy Chain | ||
Electrode | Cu Pillar | ||
Bump Size | φ20μm● | ||
Bump Height | (Cu15μm + SnAg8μm) | ||
Bump Pitch | ① 40μm | ②300μm | |
Number of Bump | ①1200 bumps | ② 714 bumps | |
Number of Chip | 312 chips/wafer | ||
Evaluation KIT | WALTS-KIT CC80MarkII-0201JY |
Specification | WM40-0103JY | ||
---|---|---|---|
Wafer Size | 8inch | ||
Wafer Thickness | 725±25μm | ||
Chip Size | 10 mm × 8 mm | ||
Function | Daisy Chain | ||
Electrode | Cu Pillar | ||
Bump Size | φ20μm● | ||
Bump Height | (Cu10μm + SnAg10μm) | ||
Bump Pitch | ① 40μm | ②300μm | |
Number of Pad | I/O area 40μm pitch x 1200 pads |
Dummy area 300μm pitch x 714 pads |
|
Number of Chip | 312 chips/wafer |
Specification | IPWM40-0101JY | ||
---|---|---|---|
Wafer Size | 8inch | ||
Wafer Thickness | 725±25μm | ||
Chip Size | 13.0mm■ | ||
Function | Daisy Chain Bump Short Check Break Down Voltage Check Between Bump |
||
Electrode | Electroless Ni/Au plating | ||
Bump Size | φ25μm● | ||
Bump Height | 2.5μm | ||
Bump Pitch | ① 40μm | ②300μm | |
Number of Bump | ①1200 Bumps | ②714 Bumps | |
Probe pad 72pad (same pad area as WM40-0103JY) |
|||
Number of Chip | 148 chips/wafer |
Specification | HBM-T-0100JY | ||
---|---|---|---|
Wafer Size | 8inch | ||
Wafer Thickness | 725±25μm | ||
Chip Size | 10.0mm×8.0mm | ||
Scribe Width | 120μm | ||
Base Layer | P-TEOS | ||
Metal Layer | TiN/AlCu | ||
PV Layer | HDP / P-SiN | ||
PV Opening | φ8μm | ||
Pad Size | 27μm■ | ||
Bump Size | φ16μm● | ||
Number of Pad | 7200 pads(I/O area) | 6544 pads(Staggerd area) | |
Number of Bump | 7200 bumps(I/O area) 6544 bumps(Staggerd area) 912 bumps(Dummy area) |
||
Number of Chip | 312 Chips / Wafer |
Specification | IPHBM-0100JY | |||
---|---|---|---|---|
Wafer Size | 8inch | |||
Wafer Thickness | 725±25μm | |||
Chip Size | 12.0mm×10.0mm | |||
Scribe Width | 120μm | |||
Base Layer | P-TEOS | |||
Metal Layer | TiN/AlCu | |||
PV Layer | HDP / P-SiN | |||
PV Opening | φ18μm | |||
Connection Pad Size | 27μm■ | |||
Probe Pad Size | 300μm■ | |||
Bump Size | NiAu2.5μm×, φ23μm● | |||
Number of Pad | 7200 pads(I/O area) 6544 pads(Staggerd area) 912 pads(Dummy area) 96 pads(Outer area) |
|||
Number of Chip | 204 Chips / Wafer |
Specification | FC150LC-0102JY |
---|---|
Wafer Size | 12 inch |
Wafer Thickness | 775±25μm |
Chip Size | 25.0mm■ |
Pad Pitch | 150 μm (Area) |
Function | Daisy Chain |
Bump Size | φ75µm● |
Electrode/Height | Cu Pillar (Cu30µm+SnAg15µm)/(Cu30µm+SnAg25µm) |
Number of Pad | 25921 pads/chip (161×161) |
Number of Chip | 89 chips/wafer |
Evaluation KIT | WALTS-KIT FC150LC-0303JY |
Specification | TEG FC120JY |
---|---|
Wafer Size | 8 inch |
Wafer Thickness | 775±25μm |
Chip Size | 10.0mm■ |
Pad Pitch | 120μm |
Function | Daisy Chain |
Pad Size | 80µm■ |
Passivation opening | φ20µm● |
Polyimide opeinng | φ40µm● |
UBM Size | φ65µm● |
Bump Size | φ60µm● |
Number of Pad | 5776 pads/chip (76×76) |
Number of Chip | 208 chips/wafer |
Evaluation KIT | WALTS-KIT FC120(S)-0101JY 2×2 |
Specification | Type-A | Type-B |
---|---|---|
Wafer Size | 8 inch | 8 inch |
Wafer Thickness | 725±25μm | 725±25μm |
Chip Size | 10.0mm■ | 10.0mm■ |
Pad Pitch | 150 μm (Area) | 150 μm (Area) |
Function | Daisy Chain | Daisy Chain |
Bump Size | φ90µm● | φ75µm● |
Electrode | Ball Mounted Solder Bump | Cu Pillar |
Number of Pad | 3721 pads/chip (61×61) | 3721 pads/chip (61×61) |
Number of Chip | 208 chips/wafer | 208 chips/wafer |
Evaluation KIT | WALTS-KIT 01A150P(S)-10-3 1×1 WALTS-KIT FC150(S)-0106JY 2×2 |
Specification | Type-A | Type-B |
---|---|---|
Wafer Size | 8 inch | 8 inch |
Wafer Thickness | 725±25μm | 725±25μm |
Chip Size | 5.02mm■ | 5.02mm■ |
Pad Pitch | 150 μm (Area) | 150 μm (Area) |
Function | Daisy Chain | Daisy Chain |
Bump Size | φ90µm● | φ80µm● |
Electrode | Ball Mounted Solder Bump | Cu Pillar |
Number of Pad | 784 pads/chip (28×28) | 784 pads/chip (28×28) |
Number of Chip | 832 chips/wafer | 832 chips/wafer |
Specification | Type-A | Type-B |
---|---|---|
Wafer Size | 8 inch | 8 inch |
Wafer Thickness | 725±25μm | 725±25μm |
Chip Size | 10.0mm■ | 10.0mm■ |
Pad Pitch | 200μm (Area) | 200μm (Area) |
Function | Daisy Chain | Daisy Chain |
Bump Size | φ110µm● | φ90µm● |
Electrode | Ball Mounted Solder Bump | Cu Pillar |
Number of Pad | 2116 pads/chip (46×46) | 2116 pads/chip (46×46) |
Number of Chip | 228 chips/wafer | 228 chips/wafer |
Evaluation KIT | WALTS-KIT 01A200P(S)-10-2 1×1 WALTS-KIT FC200-0102JY 2×2 |
Specification | Type-A | Type-B |
---|---|---|
Wafer Size | 8 inch | 8 inch |
Wafer Thickness | 725±25μm | 725±25μm |
Chip Size | 5.02mm■ | 5.02mm■ |
Pad Pitch | 200μm (Area) | 200μm (Area) |
Function | Daisy Chain | Daisy Chain |
Bump Size | φ110µm● | φ90µm● |
Electrode | Ball Mounted Solder Bump | Cu Pillar |
Number of Pad | 484 pads/chip (22×22) | 484 pads/chip (22×22) |
Number of Chip | 832 chips/wafer | 832 chips/wafer |
Specification | FBW200A | FBW150A | FBW100A | FBW80A | FBW40A | FBW20A |
---|---|---|---|---|---|---|
Wafer Size | 12 inch | 12 inch | 12 inch | 12 inch | 12 inch | 12 inch |
Wafer Thickness | 775±25μm | 775±25μm | 775±25μm | 775±25μm | 775±25μm | 775±25μm |
Bump Pitch | 200μm | 150μm | 100μm | 80μm | 40μm | 20μm |
Electrode | Cu Pillar | Cu Pillar | Cu Pillar | Cu Pillar | Cu Pillar | Cu Pillar |
Bump Size | φ90μm | φ75μm | φ50μm | φ40μm | φ20μm | φ10μm |
Bump Height | (Max.80μm) | (Max.75μm) | (Max.70μm) | (Max.45μm) | (Max.30μm) | (Max.4μm) |
Specification | FBW40 | FBW30 | FBW20 | FBW15 | FBW10 |
---|---|---|---|---|---|
Wafer Size | 8 inch | 8 inch | 8 inch | 8 inch | 8 inch |
Wafer Thickness | 725±25μm | 725±25μm | 725±25μm | 725±25μm | 725±25μm |
Bump Pitch | 40μm | 30μm | 20μm | 15μm | 10μm |
Electrode | Cu Pillar | Cu Pillar | Cu Pillar | Cu Pillar | Cu Pillar |
Bump Size | φ20μm | φ15μm | φ10μm | φ7.5μm | φ5μm |
Bump Height | (Max.30μm) | (Max.22μm) | (Max.15μm) | (Max.11μm) | (Max.7μm) |
Specification | 0.5mm pitch BGA | 0.4mm pitch BGA | 0.3mm pitch BGA |
---|---|---|---|
Wafer Size | 8 inch | 8 inch | 8 inch |
Wafer Thickness | 400±20μm | 400±20μm | 400±20μm |
Chip Size | 6.0mm■ | 6.0mm■ | 6.0mm■ |
BGA Pitch | 500μm | 400μm | 300μm |
Function | Daisy Chain | Daisy Chain | Daisy Chain |
Electrode | Ball Mounted Solder Bump | Ball Mounted Solder Bump | Ball Mounted Solder Bump |
Bamp Size | (φ300μm●) | (φ260μm●) | (φ200μm●) |
Number of Pad | 112 pins/chip | 144 pins/chip | 264 pins/chip |
Number of Chip | 714 chips/wafer | 714 chips/wafer | 712 chips/wafer |
Specification | TEG0306 | TEG03507 | TEG0408 | TEG0510 |
---|---|---|---|---|
Wafer Size | 8 inch | 8 inch | 8 inch | 8 inch |
Wafer Thickness | 400μm | 400μm | 400μm | 400μm |
Cut Size (Min.) | 600μm■ | 700μm■ | 800μm■ | 1000μm■ |
Pad Pitch | 300μm | 350μm | 400μm | 500μm |
Function | Daisy Chain | Daisy Chain | Daisy Chain | Daisy Chain |
Electrode | Ball Mounted Solder Bump | Ball Mounted Solder Bump | Ball Mounted Solder Bump | Ball Mounted Solder Bump |
Bump Size | φ205μm | φ225μm | φ260μm | φ315μm |
Number of Chip | 79257 chips/wafer | 58490 chips/wafer | 44161 chips/wafer | 28212 chips/wafer |
Specification | WALTS-TEG ME0102JY | |||||
---|---|---|---|---|---|---|
Wafer Size | 12 inch | |||||
Chip Size | 20mm×25mm | |||||
Chip Name | Chip_10_15 | Chip_20_25 | Chip_30_35 | |||
Metal Height | 5.5μm | |||||
Facing Legth | 3mm | |||||
Line/Space | 15μm/10μm | 15μm/15μm | 15μm/20μm | 15μm/25μm | 15μm/30μm | 15μm/35μm |
Pitch | 25μm | 30μm | 35μm | 40μm | 45μm | 50μm |
Number of Chip | 34 chips/wafer | 40 chips/wafer | 34 chips/wafer |
Specification | HPW-0101JY |
---|---|
Wafer Size | 8 inch(Notch) |
Wafer Thickness | 725±25μm |
Chip Size | 3.0mm■ |
Pad Pitch | 300μm |
Function | Thermal Analysis by Diode Heat Generarion by Resistance |
Electrode | Al Pad, Cu Pillar Bump, Solder Bump, Au Bump |
Number of Pad | 32 pads/chip |
Number of Chip | 2964 chips/wafer |
<Maximum Output> | Max. 14.5W/Chip |
<Option> | Back Side Metallization |
Specification | HPWTEG-150FA | HPWTEG-300FA |
---|---|---|
※Base Wafer:WALTS-TEG HPW-0101JY | ||
Wafer Size | 8 inch(Notch) | 8 inch(Notch) |
Wafer Thickness | 725±25μm | 725±25μm |
Chip Size | 3.0mm■ | 3.0mm■ |
Pad Pitch | 150μm | 300μm |
Function | Thermal Analysis by Diode Heat Generarion by Resistance |
Thermal Analysis by Diode Heat Generarion by Resistance |
Bump Size | φ110µm● | φ110µm● |
Electrode/Height | Ni+SnAg (Ni5μm+SnAg75µm) |
Cu Pillar (Cu45μm+SnAg10μm) |
Number of Pad | 32 pads/chip | 32 pads/chip |
Number of Bump | 32 bumps + 253 Dummy bumps | 32 bumps + 64 Dummy bumps |
Number of Chip | 2964 chips/wafer | 2964 chips/wafer |
<Option> | Back Side Metallization | Back Side Metallization |
Specification | HPW MarkⅡ-0101JY | |||
---|---|---|---|---|
Wafer Size | 8 inch(Notch) | |||
Wafer Thickness | 725±25μm | |||
Chip Size | 10.0mm■ | |||
Pad Pitch (Passivation opening) |
Pad①~③ | 0.4mm■ (0.3mm■) | ||
Pad④ | 2.72mm×0.5mm (2.32mm×0.3mm) | |||
Scribe line width | 120μm | |||
Function | Thermal Analysis by Diode Heat Genaration by Resistance Insulation Resistance Test by High Voltage Plate |
|||
Electrode | Al Pad | |||
Number of Pads | 12 pads | |||
Number of Chips | 244 chips/wafer | |||
Maximum Output | Max. 55W/Chip | |||
<Option> | Back Side Metallization |
Specification | LCD30A-0101JY |
---|---|
Wafer Size | 8 inch |
Wafer Thickness | 725±25μm |
Chip Size | 15.1 mm × 1.6 mm |
Pad Pitch | 30μm |
Function | Daisy Chain |
Bump Size | 20µm×100µm |
Electrode | Au (Plate) |
Number of Pad | 726 pads/chip |
Number of Chip | 1056 chips/wafer |
Evaluation KIT | WALTS-KIT LCD30-0101JY WALTS-KIT COF30-0101JY |
Specification | PWB8(TYPE-A) | PWB(TYPE-A) | PWB8(TYPE-B) | PWB(TYPE-B) |
---|---|---|---|---|
Wafer Size | φ 8 inch | φ 6 inch | φ 8 inch | φ 6 inch |
Wafer Thickness | 725±25μm | 625±25μm | 725±25μm | 625±25μm |
Chip Size | 6.0mm■ | 6.0mm■ | 6.0mm■ | 6.0mm■ |
Metal Thickness | Al-Si-Cu 4μm | Al-Si 3μm | Al-Si 4μm | Al-Si 4.6μm |
Function | Bondability Check | Bondability Check | Bondability Check | Bondability Check |
Pad config | Plane | Plane | Plane | Plane |
Pad Size | 5060×2420μm 270×5300μm |
5060×2420μm 270×5300μm |
5060×2420μm 270×5300μm |
5060×2420μm 270×5300μm |
Passivation Opening | 5040×2420μm 250×5280μm |
5040×400μm 250×5280μm |
5040×2420μm 250×5280μm |
5040×400μm 250×5280μm |
Scribe width | 100μm | 100μm | 100μm | 100μm |
Specification | ITO1101-0100JY |
---|---|
Wafer Size | 8 inch |
Wafer Thickness | 725±25μm |
Chip Size | 20.0mm■ |
Numver of pad | 56 pads/chip |
Pad size | 160μm■ |
Number of chip | 57 chips/wafer |
Specification | ITO1102-0100JY |
---|---|
Wafer Size | 8 inch |
Wafer Thickness | 725±25μm |
Chip Size | 20.0mm■ |
Numver of pad | 56 pads/chip |
Pad size | 160μm■ |
Number of chip | 57 chips/wafer |