- TEG産品一覧表
-
Material |
Au |
Solder |
Cu |
Ni |
Electroless Ni/Au |
Function |
- |
+SnAg |
+Ni +SnAg |
+Ni +Au |
- |
+SnAg |
Form |
PLATE |
STUD |
PLATE |
MOUNT |
PLATE |
PLATE |
PLATE |
PLATE |
PLATE |
PLATE |
PLATE |
- |
Image |
 |
 |
 |
 |
 |
 |
 |
 |
 |
 |
 |
- |
MB50 |
● |
● |
● |
- |
● |
● |
● |
● |
● |
● |
- |
Daisy |
MB60 |
● |
● |
● |
- |
● |
● |
● |
● |
● |
● |
- |
Daisy |
MB80 |
● |
● |
● |
- |
● |
● |
● |
● |
● |
● |
- |
Daisy |
MB130 |
● |
● |
● |
- |
● |
● |
● |
● |
● |
● |
● |
Daisy |
CC40 |
● |
- |
● |
- |
● |
● |
● |
● |
● |
● |
- |
Daisy |
IP40 |
- |
- |
- |
- |
● |
● |
● |
● |
● |
● |
● |
Daisy/Vernier
Bump Short/
Breakdown Voltage |
CC80 |
● |
● |
● |
- |
● |
● |
● |
● |
● |
● |
- |
Daisy |
IP80 |
- |
- |
- |
- |
● |
● |
● |
● |
● |
● |
● |
Daisy |
CC80TSV |
- |
- |
- |
- |
- |
● |
● |
- |
- |
- |
●/◎ |
TSV |
CC80MarkⅡ |
● |
● |
● |
- |
● |
● |
● |
● |
● |
● |
- |
Daisy/Migration |
CC80MarkⅡWM |
- |
- |
- |
- |
● |
● |
- |
- |
- |
- |
◎ |
Daisy/Migration |
WM40-0101 |
- |
- |
- |
- |
◎ |
● |
- |
- |
- |
- |
- |
- |
CC80MarkⅢ |
- |
- |
- |
- |
● |
● |
- |
- |
- |
- |
◎ |
Daisy/Migration |
WM40-0102 |
- |
- |
- |
- |
- |
● |
- |
- |
- |
- |
- |
Daisy |
CC80MarkⅣ |
- |
- |
- |
- |
● |
● |
- |
- |
- |
- |
- |
Daisy |
IP80MarkⅣ |
- |
- |
- |
- |
- |
- |
- |
- |
- |
- |
● |
Daisy |
FC150LC |
- |
- |
- |
- |
● |
● |
- |
- |
- |
- |
- |
Daisy |
FC150(Si) |
- |
- |
● |
● |
● |
● |
● |
● |
● |
- |
● |
Daisy |
FC150(Glass) |
- |
- |
● |
● |
● |
● |
● |
● |
● |
● |
● |
- |
FC150SC |
- |
- |
● |
● |
● |
● |
● |
● |
● |
● |
● |
Daisy |
FC200(Si) |
- |
- |
● |
● |
● |
● |
● |
● |
● |
● |
● |
Daisy |
FC200(Glass) |
- |
- |
● |
● |
● |
● |
● |
● |
● |
● |
● |
- |
FC200SC |
- |
- |
● |
● |
● |
● |
● |
● |
● |
● |
● |
Daisy |
FBW |
- |
- |
- |
- |
● |
● |
● |
- |
- |
- |
- |
- |
WLP |
- |
- |
- |
● |
- |
- |
- |
- |
- |
- |
- |
Daisy |
ME |
- |
- |
- |
- |
- |
- |
- |
- |
- |
- |
- |
Migration |
STAC |
● |
● |
● |
- |
● |
● |
● |
● |
● |
● |
- |
Stress/
Thermal/
HeatGeneration |
STAC150FA |
- |
- |
- |
- |
● |
● |
● |
● |
● |
● |
- |
Stress/
Thermal/
HeatGeneration |
STAC300FA |
- |
- |
- |
- |
● |
● |
● |
● |
● |
● |
- |
Stress/
Thermal/
HeatGeneration |
HPW |
● |
● |
● |
- |
● |
● |
● |
● |
● |
● |
- |
Thermal/
Heat Generation |
HPW150FA |
- |
- |
- |
- |
● |
● |
● |
● |
● |
● |
- |
Thermal/
Heat Generation |
HPWTSV |
- |
- |
- |
- |
- |
● |
- |
- |
- |
- |
◎ |
TSV |
LCD30 |
● |
- |
● |
- |
● |
● |
● |
● |
● |
● |
● |
Daisy/
Breakdown Voltage |
PWB |
- |
- |
- |
- |
- |
- |
- |
- |
- |
- |
- |
Bondability |
● Top Side / ◎Bottom Side
-
|
Specification |
Type-A |
Type-B |
Type-C (Glass) |
Wafer Size |
φ 8 inch |
φ 8 inch |
φ 8 inch |
Wafer Thickness |
725±25µm |
725±25µm |
700±70µm |
Chip Size |
7.3mm■ |
7.3mm■ |
7.3mm■ |
Pad Pitch |
50µm |
50µm |
50µm |
Function |
Daisy Chian |
Daisy Chian |
- |
Bump Size |
- |
Au: 30µm■
Cu: 30µm■
Cu: φ25µm● |
Cu: 30µm■
Cu: φ25µm● |
Bump Height |
- |
(Cu30µm+SnAg15µm) |
(Cu30µm+SnAg15µm) |
Number of Pad |
544 pads/chip |
544 pads/chip |
- |
Number of Chip |
478 chips/wafer |
478 chips/wafer |
478 chips/wafer |
Polyimide (Option) |
○ |
○ |
○ |
Evaluation KIT |
WALTS-KIT MB50-0102JY_NCR【Standard】
WALTS-KIT MB50-0104JY_CR【Standard】
WALTS-KIT MB50-0105JY_CR【Standard】
WALTS-KIT MB50-0102JY_NCR【MAP】
WALTS-KIT MB50-0103JY_CR【MAP】
WALTS-KIT MB50-0104JY_CR【MAP】
|
|
|
Specification |
MB60-0101JY |
Wafer Size |
φ8inch |
Wafer Thickness |
725±25µm |
Chip Size |
7.3mm■ |
Pad Pitch |
60µm |
Function |
Daisy Chain |
Bump Size |
- |
Bump Height |
- |
Number of Pad |
448 pads/chip |
Number of Chip |
478 chips/wafer |
Polymide(option) |
○ |
Evaluation KIT |
- |
|
|
Specification |
Type-A |
Type-B |
Wafer Size |
φ8inch |
φ8inch |
Wafer Thickness |
725±25µm |
725±25µm |
Chip Size |
7.3mm■ |
7.3mm■ |
Pad Pitch |
80µm Staggred |
80µm Staggred |
Function |
Daisy Chain |
Daisy Chain |
Bump Size |
- |
38µm■ |
Bump Height |
(Wire Bonding) |
(Cu30µm+SnAg15µm) |
Number of Pad |
648 pads/chip
82 pads × 4(Outer Line)
80 pads × 4(Inner Line) |
648 pads/chip
82 pads × 4(Outer Line)
80 pads × 4(Inner Line) |
Number of Chip |
478 chips/wafer |
478 chips/wafer |
Polyimide(Option) |
○ |
○ |
|
|
Specification |
AS8R |
Wafer Size |
φ8inch |
Wafer Thickness |
725±25µm |
Chip Size |
3.5mm■ |
Pad Pitch |
120µm |
Function |
Daisy Chain |
Bump Size |
- |
Bump Height |
- |
Number of Pad |
96 pads/chip(Outer Line)
88 pads/chip(Inner Line) |
Number of Chip |
2266 chip/wafer |
Polyimide(Option) |
○ |
Evaluation KIT |
- |
|
|
Specification |
MB130 |
MB130A |
TYPE-A |
TYPE-B |
Wafer Size |
φ6inch |
φ6inch |
φ8inch |
Wafer Thickness |
550±25µm |
550±25µm |
725±25µm |
Chip Size |
2.13mm■ |
2.13mm■ |
2.13mm■ |
Pad Pitch |
130µm |
130µm |
130µm |
Function |
Daisy Chain |
Daisy Chain |
Daisy Chain |
Bump Size |
- |
70µm■ |
- |
Bump Height |
(Wire Bonding)
(Au Stud Bump) |
(Cu30µm+SnAg15µm) |
(Wire Bonding)
(Au Stud Bump) |
Number of Pad |
108 pads/chip
15 pads × 4
(Outer Line)
12 pads × 4
(Inner Line) |
108 pads/chip
15 pads × 4
(Outer Line)
12 pads × 4
(Inner Line) |
108 pads/chip
15 pads × 4
(Outer Line)
12 pads × 4
(Inner Line) |
Number of Chip |
3300 chips/wafer |
3300 chips/wafer |
6060 chips/wafer |
Polyimide(Option) |
○ |
○ |
○ |
Evaluation KIT |
- |
- |
- |
|
|
Specification |
MB6020-0102JY |
Wafer Size |
φ8inch |
Wafer Thickness |
725±25µm |
Chip Size |
3.0mm■ |
Pad Pitch |
60/55/50/45/40/35/30/25/20µm |
Function |
Daisy Chain |
Bump Size |
- |
Bump Height |
- |
Number of Pad |
(40×4) (40×4)(38×4)
(38×4)(36×4)(34×4)
(30×4)(26×4)(18×4) |
Number of Chip |
3016 chips/wafer |
Polyimide(Option) |
- |
Evaluation KIT |
- |
|
|
Specification |
CC40-0101JY |
Wafer Size |
φ8inch |
Wafer Thickness |
725±25µm |
Chip Size |
7.3 mm■ |
Pad Pitch |
Model I:40µm Staggered + 40um Full Area
Model II:40µm Staggered |
Function |
Daisy Chain |
Bump Size |
Model I:φ22µm
Model II:φ22µm |
Bump Height |
(Cu15µm+SnAg10µm) |
Number of Pad |
Model I:29576 pads/chip
Model II:1352 pads/chip |
Number of Chip |
478 chips/wafer |
Polyimide(Option) |
- |
Evaluation KIT |
WALTS-TEG IP40-0101JY (Silicon Interposer)
WALTS-TEG IP40A-0101JY (Silicon Interposer) |
|
|
Specification |
IP40-0101JY (Model I / Model II) |
Wafer Size |
φ 8 inch |
Wafer Thickness |
725±25µm |
Chip Size |
10.0 mm■ |
Pad Pitch |
(1) 40µm pitch Full area + Staggered (Model I)
40µm pitch Staggered (Model II)
(2) 250µm pitch Periphera (Outer Pad) |
Function |
Daisy Chain
Bump Short Check
Vernier
Breakdown Voltage Check between the Bumps |
Bump Size |
- |
Bump Height |
- |
Number of Pad |
Model I :(1) 29576 pads/chip
(2) 124 pads/chip (Outer Pad)
Model II :(1) 1352 pads/chip
(2) 124 pads/chip (Outer Pad) |
Number of Chip |
228 chips/wafer |
Polyimide(Option) |
- |
Evaluation KIT |
- |
|
|
Specification |
IP40A-0101JY (Model I) |
Wafer Size |
φ12inch |
Wafer Thickness |
775±25µm |
Chip Size |
10.0mm■ |
Pad Pitch |
(1) 40µm pitch Full area + Staggered (Model I)
(2) 250µm pitch Peripheral (Outer Pad) |
Function |
Daisy Chain
Bump Short Check
Vernier
Breakdown Voltage Check between the Bumps |
Bump Size |
- |
Bump Height |
- |
Number of Pad |
Model I: (1) 29576 pads/chip
(2) 124 pads/chip (Outer Pad) |
Number of Chip |
616 chips/wafer |
Polyimide (Option) |
- |
Evaluation KIT |
- |
|
|
Specification |
CC80-0101JY |
Wafer Size |
φ8inch |
Wafer Thickness |
725±25µm |
Chip Size |
7.3mm■ |
Pad Pitch |
80µm Staggered (Peripheral)
300µm Full Area (Center Core) |
Function |
Daisy Chain |
Bump Size |
Model I: 38µm■ or φ42µm●
Model II: 38µm■
Model III:38µm■ |
Bump Height |
(Cu30µm+SnAg15µm) |
Number of Pad |
Model I:1048 pads/chip
Model II: 904pads/chip
Model III:728pads/chip
Model IV: 648pads/chip |
Number of Chip |
478 chips/wafer |
Polyimide (Option) |
○ |
Evaluation KIT |
WALTS-TEG IP80-STG0101JY(Silicon Interposer)
WALTS-KIT CC80-0104JY |
|
|
Specification |
IP80-0101JY |
Wafer Size |
φ8inch |
Wafer Thickness |
725±25µm |
Chip Size |
10.0mm■ |
Pad Pitch |
(1) 80µm Staggered (Inner Pad)
(2) 300µm Full Area (Center Core)
(3) 250µm Peripheral(Outer Pad) |
Function |
Daisy Chain |
Bump Size |
- |
Bump Height |
- |
Number of Pad |
(1)648 pads/chip
(2)400 pads/chip
(3)124 pad /chip |
Number of Chip |
228 chips/wafer |
Polyimide (Option) |
○ |
Evaluation KIT |
- |
|
|
Specification |
CC80TSV-1 |
CC80TSV-2 |
Wafer Size |
φ 8 inch |
φ 8 inch |
Chip Thickness |
100µm |
100µm |
Chip Size |
7.3 mm■ |
7.3 mm■ |
Pad Pitch |
80µm Staggered (Periphera)
300µm Full Area (Center Core) |
80μm Staggered (Periphera)
300μm Full Area (Center Core) |
TSV Hole Diameter |
φ40µm● |
φ40µm● |
Top
Side |
Electrode |
Electroless Ni/Au |
Cu+SnAg |
Bump Size |
φ48µm●
(Option: φ42µm●) |
38µm■
(Option: φ42µm●) |
Bump Height |
(8~12µm) |
(Cu20µm+SnAg15µm) |
Bottom
Side |
Electrode |
Electroless Ni/Au |
Electroless Ni/Au |
Bump Size |
φ48µm●
(Option: φ42µm●) |
φ48µm●
(Option: φ42µm●) |
Bump Height |
(8~12µm) |
(8~12µm) |
Number of Chip |
478 chips/wafer |
478 chips/wafer |
Evaluation KIT |
WALTS-TEG CC80-0101JY
WALTS-TEG IP80-0101JY (Silicon Interposer) |
|
|
Specification |
CC80MarkII-0101JY【STD】 |
Wafer Size |
φ8inch |
Chip Thickness |
725±25µm |
Chip Size |
12.0mm■ |
Pad Pitch |
80µm Staggered(Peripheral)
200µm Full Area(Center Core) |
Function |
Daisy Chain & Migration |
Bump Size |
φ31µm● |
Bump Height |
(Cu30µm+SnAg15µm) |
Number of Pad |
1660 pads/chip (Peripheral)
2916 pads/chip (Center Core) |
Number of Chip |
177 chips/wafer |
Polyimide (Option) |
- |
Evaluation KIT |
WALTS-KIT CC80MarkII-0201JY |
|
|
Specification |
CC80MarkII WM-0101JY
※Base Wafer:WALTS TEG CC80MarkII-0101JY
|
Wafer Size |
8inch |
Wafer Thickness |
100µm |
Chip Size |
10 mm × 8 mm |
Function |
Daisy Chain & Migration (Top Side) |
Top
Side |
Electrode |
Cu Pillar |
Bump Size |
φ31µm● |
Bump Height |
(Cu 20µm + SnAg 15µm) |
Bottom
Side |
Electrode |
Cu Post |
Bump Size |
φ26µm● |
Bump Pitch |
(1) 40µm |
(2) 300µm |
Number of Bump |
(1) 1200 bumps |
(2) 714 bumps |
Bump Height |
(Cu 6µm) |
Number of Chip |
177 chips/wafer |
Evaluation KIT |
WALTS-KIT CC80MarkII-0201JY WALTS-TEG WM40-0101JY |
|
|
Specification |
WM40-0101JY |
Wafer Size |
8inch |
Wafer Thickness |
50µm |
Chip Size |
10 mm × 8 mm |
Function |
- |
Top
Side |
Electrode |
Cu Pillar |
Bump Size |
Φ20µm● |
Bump Height |
(Cu 15µm + SnAg 8µm) |
Bump Pitch |
(1) 40µm |
(2) 300µm |
Number of Bump |
(1) 1200 bumps |
(2) 714 bumps |
Bottom
Side |
Electrode |
Cu Post |
Bump Size |
Φ26µm● |
Bump Pitch |
(1) 40µm |
(2) 300µm |
Number of Bump |
(1) 1200 bumps |
(2) 714 bumps |
Bump Height |
(Cu 6µm) |
Number of Chip |
312 chips/wafer |
Evaluation KIT |
WALTS-KIT CC80MarkII-0201JY |
|
|
Specification |
CC80MarkIII-0101JY |
Wafer Size |
6inch |
Wafer Thickness |
100µm or 350µm |
Chip Size |
12.0 mm × 12.0 mm |
Function |
Daisy Chain & Migration(Top Side)
Daisy Chain (Bottom Side) |
Top
Side |
Electrode |
Cu Pillar |
Bump Size |
Φ31µm● |
Pad Pitch |
(1) 80µm Three Rows Staggered (Peripheral)
(2)200µm Full Area (Center Core) |
Number of Bump/Pad |
(1) 1660bumps/1660pads (Peripheral)
(2)2916bumps/2916pads (Center Core) |
Bottom
Side |
Electrode |
Electroless Ni/Au |
Bump Size |
Φ20µm● |
Bump Pitch |
(1) 40µm (Center Core)
(2) 300µm (Peripheral)
(3) 550µm (Outer Pad) |
Number of Bump |
(1) 120 pads (Center Core)
(2) 714 pads (Peripheral)
(3) 40 pads (Outer Pad) |
Number of Chip |
89 chips/wafer |
Evaluation KIT |
WALTS-KIT CC80MarkII-0201JY WALTS-TEG WM40-0102JY |
|
|
Specification |
WM40-0102JY |
Wafer Size |
8inch |
Wafer Thickness |
725±25µm |
Chip Size |
10 mm × 8 mm |
Function |
Daisy Chain |
Electrode |
Cu Pillar |
Bump Size |
φ20µm● |
Bump Height |
(Cu15µm + SnAg8µm) |
Bump Pitch |
(1) 40µm
(2)300µm |
Number of Bump |
(1) 1200 bumps
(2) 714 bumps |
Number of Chip |
312 chips/wafer |
Evaluation KIT |
WALTS-KIT CC80MarkII-0201JY |
|
|
Specification |
CC80MarkIV-0101JY |
Wafer Size |
8inch |
Chip |
Chip A |
Chip B |
Chip Size |
6.0 mm × 10.0 mm |
4.0 mm × 10.0 mm |
Pad Pitch |
(1) 40µm[10Row]×50µm[192Row] (Peripheral)
(2) 80µm staggered[3Row](Center core)
(3) 150µm Min. Lattice
|
Function |
Daisy Chain |
Electrode |
Cu Pillar |
Bump Size |
φ25µm● |
Number of Bump/Pad |
(1)1920bumps/1920pads
(2) 687 bumps/ 687 pads
(3) 1743bumps/1743pads |
(1)1920bumps/1920pads
(2) 531 bumps/ 531 pads
(3) 978 bumps/ 978 pads |
Number of Chip |
Chip A:228chips/wafer
Chip B:228chips/wafer |
Evaluation KIT |
WALTS-TEG IP80MarkIV-0101JY (Sillicon Interposer) |
|
|
Specification |
IP80MarkIV-0101JY |
Wafer Size |
8inch |
Wafer Thickness |
725±25µm |
Chip Size |
15.0 mm × 15.0 mm |
Pad Pitch |
(1) 40µm[10Row]×50µm[192Row]×2 (Peripheral)
(2) 80µm staggered[3Row](Center core)
(3) 150µm Min. Lattice
(4) 300µm (Staggered) |
Function |
Daisy Chain |
Electrode |
Electroless Ni/Au plating |
Bump Size |
(1)27µm●
(2)27µm●
(3)27µm●
(4)141µm■ |
Number of Bump/Pad |
(1)3840bumps/3840pads
(2)1172bumps/1172pads
(3)2721bumps/2721pads
(4)328bumps/328pads |
Number of Chip |
97 chips/wafer |
Evaluation KIT |
- |
|
|
Specification |
FC150LC-0101JY |
Wafer Size |
φ12 inch |
Wafer Thickness |
775±25µm |
Chip Size |
25.0mm■ |
Pad Pitch |
150µm (Area) |
Function |
Daisy Chian |
Bump Size |
φ75µm● |
Bump Height |
Cu pillar (Cu30µm+SnAg15µm) |
Number of Pad |
25921 pads/chip (161×161) |
Number of Chip |
89 chips/wafer |
Polyimide (Option) |
○ |
Evaluation KIT |
WALTS-KIT FC150LC-0302JY |
|
|
Specification |
Type-A |
Type-B |
Wafer Size |
φ 8 inch |
φ 8 inch |
Wafer Thickness |
725±25µm |
725±25µm |
Chip Size |
10.0mm■ |
10.0mm■ |
Pad Pitch |
150µm (Area) |
150µm (Area) |
Function |
Daisy Chian |
Daisy Chian |
Bump Size |
φ85µm● |
φ75µm● |
Bump Height |
Ball Mounted Solder Bump (80µm) |
Cu Pillar (Cu30µm+SnAg15µm) |
Number of Pad |
3721 pads/chip (61×61) |
3721 pads/chip (61×61) |
Number of Chip |
208 chips/wafer |
208 chips/wafer |
Polyimide (Option) |
○ |
○ |
Evaluation KIT |
WALTS-KIT 01A150P-10-2
WALTS-KIT FC150-0103JY
2×2
WALTS-KIT FC150-0104JY
2×2
WALTS-KIT FC150R-0102JY 2×2 |
WALTS-KIT 01A150P-10-2
WALTS-KIT FC150-0103JY
2×2
WALTS-KIT FC150-0104JY
2×2
WALTS-KIT FC150R-0102JY 2×2 |
|
|
Specification |
Type-A |
Type-B |
Wafer Size |
φ8 inch |
φ8 inch |
Wafer Thickness |
700±70µm |
700±70µm |
Chip Size |
10.0mm■ |
10.0mm■ |
Pad Pitch |
150µm (Area) |
150µm (Area) |
Function |
- |
- |
Bump Size |
φ85µm● |
φ75µm● |
Bump Height |
Ball Mounted Solder Bump (80µm) |
Cu Pillar (Cu30µm+SnAg15µm) |
Number of Pad |
3721 pads/chip (61×61) |
3721 pads/chip (61×61) |
Number of Chip |
228 chips/wafer |
228 chips/wafer |
Polyimide (Option) |
208 chips/wafer |
208 chips/wafer |
Evaluation KIT |
WALTS-KIT 01A150P-10-2
WALTS-KIT FC150-0103JY 2×2
WALTS-KIT FC150-0104JY 2×2
WALTS-KIT FC150R-0102JY 2×2 |
WALTS-KIT 01A150P-10-2
WALTS-KIT FC150-0103JY 2×2
WALTS-KIT FC150-0104JY 2×2
WALTS-KIT FC150R-0102JY 2×2 |
|
|
Specification |
Type-A |
Type-B |
Wafer Size |
φ8 inch |
φ8 inch |
Wafer Thickness |
725±25µm |
725±25µm |
Chip Size |
5.02mm■ |
5.02mm■ |
Pad Pitch |
150µm (Area) |
150µm (Area) |
Function |
Daisy Chian |
Daisy Chian |
Bump Size |
φ85µm● |
φ75µm● |
Bump Height |
Ball Mounted Solder Bump (80µm) |
Cu Pillar (Cu30µm+SnAg15µm) |
Number of Pad |
784 pads/chip (28×28) |
784 pads/chip (28×28) |
Number of Chip |
832 chips/wafer |
832 chips/wafer |
Polyimide (Option) |
○ |
○ |
Evaluation KIT |
- |
- |
|
|
Specification |
Type-A |
Type-B |
Wafer Size |
φ8 inch |
φ8 inch |
Wafer Thickness |
725±25µm |
725±25µm |
Chip Size |
10.0mm■ |
10.0mm■ |
Pad Pitch |
200µm (Area) |
200µm (Area) |
Function |
Daisy Chian |
Daisy Chian |
Bump Size |
φ100µm● |
φ90µm● |
Bump Height |
Ball Mounted Solder Bump (80µm) |
Cu Pillar (Cu30µm+SnAg15µm) |
Number of Pad |
2116 pads/chip (46×46) |
2116 pads/chip (46×46) |
Number of Chip |
228 chips/wafer |
228 chips/wafer |
Polyimide (Option) |
○ |
○ |
Evaluation KIT |
WALTS-KIT 01A200P-10
WALTS-KIT 01A200P-10_C400
WALTS-KIT FC200-0101JY
2×2
WALTS-KIT FC200-0102JY
2×2 |
WALTS-KIT 01A200P-10
WALTS-KIT 01A200P-10_C400
WALTS-KIT FC200-0101JY
2×2
WALTS-KIT FC200-0102JY
2×2 |
|
|
Specification |
Type-A |
Type-B |
Wafer Size |
φ8 inch |
φ8 inch |
Wafer Thickness |
700±70µm |
700±70µm |
Chip Size |
10.0mm■ |
10.0mm■ |
Pad Pitch |
200µm (Area) |
200µm (Area) |
Function |
- |
- |
Bump Size |
φ100µm● |
φ90µm● |
Bump Height |
Ball Mounted Solder Bump (80µm) |
Cu Pillar (Cu30µm+SnAg15µm) |
Number of Pad |
2116 pads/chip (46×46) |
2116 pads/chip (46×46) |
Number of Chip |
228 chips/wafer |
228 chips/wafer |
Polyimide (Option) |
○ |
○ |
Evaluation KIT |
WALTS-KIT 01A200P-10
WALTS-KIT 01A200P-10_C400
WALTS-KIT FC200-0101JY 2×2
WALTS-KIT FC200-0102JY 2×2 |
WALTS-KIT 01A200P-10
WALTS-KIT 01A200P-10_C400
WALTS-KIT FC200-0101JY 2×2
WALTS-KIT FC200-0102JY 2×2 |
|
|
Specification |
Type-A |
Type-B |
Wafer Size |
φ8 inch |
φ8 inch |
Wafer Thickness |
725±25µm |
725±25µm |
Chip Size |
5.02mm■ |
5.02mm■ |
Pad Pitch |
200µm (Area) |
200µm (Area) |
Function |
Daisy Chian |
Daisy Chian |
Bump Size |
φ100µm● |
φ90µm● |
Bump Height |
Ball Mounted Solder Bump (80µm) |
Cu Pillar (Cu30µm+SnAg15µm) |
Number of Pad |
484 pads/chip (22×22) |
484 pads/chip (22×22) |
Number of Chip |
832 chips/wafer |
832 chips/wafer |
Polyimide (Option) |
○ |
○ |
Evaluation KIT |
WALTS-KIT FC200SC-0202JY 2×3
WALTS-KIT FC200SC-0202JY 3×3 |
WALTS-KIT FC200SC-0202JY 2×3
WALTS-KIT FC200SC-0202JY 3×3 |
|
|
Specification |
FBW200 |
FBW150 |
FBW130 |
FBW100 |
FBW80 |
Wafer Size |
φ8 inch |
φ8 inch |
φ8 inch |
φ8 inch |
φ8 inch |
Wafer Thickness |
725±25µm |
725±25µm |
725±25µm |
725±25µm |
725±25µm |
Bump Pitch |
200µm |
150µm |
130µm |
100µm |
80µm |
Electrode |
Cu Pillar |
Cu Pillar |
Cu Pillar |
Cu Pillar |
Cu Pillar |
Bump Size |
φ90µm |
φ75µm |
φ65µm |
φ50µm |
φ40µm |
Bump Height |
(Max.60µm) |
(Max.60µm) |
(Max.60µm) |
(Max.60µm) |
(Max.50µm) |
|
|
Specification |
0.4mm pitch BGA |
0.3mm pitch BGA |
Wafer Size |
φ8 inch |
φ8 inch |
Wafer Thickness |
400±20µm |
400±20µm |
Chip Size |
6.0mm■ |
6.0mm■ |
BGA Pitch |
400µm |
300µm |
Function |
Daisy Chain |
Daisy Chain |
Electrode |
Ball Mounted Solder Bump |
Ball Mounted Solder Bump |
Pad Size |
φ227µm● |
φ177µm● |
Number of Pad |
144 pins/chip |
264 pins/chip |
Number of Chip |
712 chips/wafer |
712 chips/wafer |
|
|
Specification |
TEG0306 |
TEG0408 |
TEG0510 |
Wafer Size |
φ8 inch |
φ8 inch |
φ8 inch |
Wafer Thickness |
400µm |
400µm |
400µm |
Cut Size (Min.) |
600µm■ |
800µm■ |
1000µm■ |
Pad Pitch |
300µm |
400µm |
500µm |
Function |
Daisy Chain |
Daisy Chain |
Daisy Chain |
Electrode |
Ball Mounted Solder Bump |
Ball Mounted Solder Bump |
Ball Mounted Solder Bump |
Post Size |
175µm |
200µm |
250µm |
Number of Chip |
79257 chips/wafer |
44161 chips/wafer |
28212 chips/wafer |
|
|
Specification |
WALTS-TEG MC03-0101JY |
Wafer Size |
φ 8 inch |
Wafer Thickness |
725µm±25µm |
Chip Size |
0.3mm■ |
0.4mm■ |
0.5mm■ |
Pad Pitch |
120µm |
220µm |
320µm |
Function |
Daisy Chain |
Daisy Chain |
Daisy Chain |
Pad Metal Size |
X: 65µm
Y: 170µm |
X: 65µm
Y: 270µm |
X: 65µm
Y: 370µm |
Bump Size |
40µm |
Bump Height |
Au(10µm) |
Number of Chip |
149,216
chips/wafer |
80,816
chips/wafer |
26,604
chips/wafer |
Evaluation KIT |
--- |
|
|
Specification |
WALTS-TEG ME0102JY |
Wafer Size |
φ 12 inch |
Chip Size |
20mm×25mm |
Chip Name |
Chip_10_15 |
Chip_20_25 |
Chip_30_35 |
Metal Height |
5.5µm |
Facing Legth |
3mm |
Line/Space |
15µm/10µm |
15µm/15µm |
15µm/20µm |
15µm/25µm |
15µm/30µm |
15µm/35µm |
Pitch |
25µm |
30µm |
35µm |
40µm |
45µm |
50µm |
Number of Chip |
34 chips/wafer |
40 chips/wafer |
34 chips/wafer |
|
|
Specification |
STAC-0101JY |
Wafer Size |
φ 6 inch(Orientation Flat) |
Wafer Thickness |
550±25µm |
Chip Size |
3.0mm■ |
Pad Pitch |
300µm |
Function |
Stress Analysis by Piezoresistance
Thermal Analysis by Diode
Heat Generarion by Resistance |
Electrode |
(Al Pad, Cu Pillar Bump, Solder Bump, Au Bump) |
Number of Pad |
32 pads/chip |
Number of Chip |
1596 chips/wafer |
Polyimide (Option) |
○ |
Option |
Back Side Metallization |
Evaluation KIT |
WALTS-KIT STAC-0201JY |
|
※Base Wafer:WALTS-TEG STAC-0101JY
|
Specification |
STACTEG-150FA |
STACTEG-300FA |
Wafer Size |
φ 6 inch (Orientation Flat) |
φ 6 inch (Orientation Flat) |
Wafer Thickness |
550±25µm |
550±25µm |
Chip Size |
3.0mm■ |
3.0mm■ |
Pad Pitch |
150µm |
300µm |
Function |
Stress Analysis by Piezoresistance
Thermal Analysis by Diode
Heat Generarion by Resistance |
Stress Analysis by Piezoresistance
Thermal Analysis by Diode
Heat Generarion by Resistance |
Bump Size |
φ110µm● |
φ110µm● |
Bump Height |
(Ni5µm+SnAg75µm) |
(Cu50µm+SnAg10µm) |
Number of Pad |
32 pads/chip |
32 pads/chip |
Number of Bump |
32 bumps + 253 Dummy bumps |
32 bumps + 64 Dummy bumps |
Number of Chip |
1596 chips/wafer |
1596 chips/wafer |
Polyimide (Option) |
○ |
○ |
Option |
Back Side Metallization |
Back Side Metallization |
Evaluation KIT |
WALTS-KIT STAC-0201JY |
WALTS-KIT STAC-0201JY |
|
|
Specification |
HPW-0101JY |
Wafer Size |
φ 8 inch(Notch) |
Wafer Thickness |
725±25µm |
Chip Size |
3.0mm■ |
Pad Pitch |
300µm |
Function |
Thermal Analysis by Diode
Heat Generarion by Resistance |
Electrode |
(Al Pad, Cu Pillar Bump, Solder Bump, Au Bump) |
Number of Pad |
32 pads/chip |
Number of Chip |
2964 chips/wafer |
Polyimide (Option) |
○ |
Maximum Output |
Max. 14.5W/Chip |
Option |
Back Side Metallization |
|
※Base Wafer:WALTS-TEG HPW-0101JY
|
Specification |
HPWTEG-150FA |
HPWTEG-300FA |
Wafer Size |
φ 8 inch(Notch) |
φ 8 inch(Notch) |
Wafer Thickness |
725±25µm |
725±25µm |
Chip Size |
3.0mm■ |
3.0mm■ |
Pad Pitch |
150µm |
300µm |
Function |
Thermal Analysis by Diode
Heat Generarion by Resistance |
Thermal Analysis by Diode
Heat Generarion by Resistance |
Bump Size |
φ110µm● |
φ110µm● |
Bump Height |
(Ni5µm+SnAg75µm) |
(Cu50µm+SnAg10µm) |
Number of Pad |
32 pads/chip |
32 pads/chip |
Number of Bump |
32 bumps + 253 Dummy bumps |
32 bumps + 64 Dummy bumps |
Number of Chip |
2964 chips/wafer |
2964 chips/wafer |
Option |
Back Side Metallization |
Back Side Metallization |
Evaluation KIT |
- |
|
※Base Wafer:WALTS-TEG HPW-0101JY(SiN)
|
Specification |
HPW TSV-0101JY |
Wafer Size |
φ 8 inch(Notch) |
Wafer Thickness |
100µm |
Chip Size |
3.0mm■ |
Top
Side |
Electrode |
Cu Pillar |
Bump Pitch |
300µm |
Bump Size |
φ100µm● |
Bump Height |
(Cu50µm+SnAg10µm) |
Number of Bump |
32 bumps + 64 Dummy bumps |
TSV |
Via Size |
φ90µm● |
Bottom
Side |
Electrode |
Electroless Ni/Au Plating |
Bump Pitch |
300µm |
Bump Size |
φ100µm● |
Bump Height |
(8µm) |
Number of Bump |
32 bumps |
Number of Chip |
2964 chips/wafer |
Evaluation KIT |
- |
|
|
Specification |
Type-A |
Type-B |
Type-C |
Wafer Size |
φ 5 inch |
φ 5 inch |
φ 5 inch |
Wafer Thickness |
625µm |
625µm |
625µm |
Chip Size |
3.2mm■ |
1.6mm■ |
0.8mm■ |
Pad Pitch |
any |
any |
any |
Function |
Fever resistance |
Fever resistance |
Fever resistance |
Bump Size |
- |
- |
- |
Bump Height |
- |
- |
- |
Number of Pad |
20 pads/chip |
12 pads/chip |
8 pads/chip |
Number of Chip |
655 chips/wafer |
974 chips/wafer |
1272 chips/wafer |
Polyimide (Option) |
○ |
○ |
○ |
Evaluation KIT |
- |
- |
- |
|
|
Specification |
LKWB120 |
Wafer Size |
φ 12 inch |
Wafer Thickness |
775±25µm |
Chip Size |
10.0mm■ |
Pad Pitch |
120µm Staggered |
Function |
Daisy Chian,Comb tooth Capacitor,Serpentine Resistor,Interlayer Capacitor,ViaChain |
Bump Size |
- |
Bump -Height |
- |
Number of Pad |
616 pads/chip |
Number of Chip |
636 chips/wafer |
Polyimide (Option) |
○ |
Evaluation KIT |
WALTS-KIT LKWB120 |
|
|
Specification |
PWB0101JY |
Wafer Size |
φ 6 inch |
Wafer Thickness |
625±25µm |
Chip Size |
6.0mm■ |
Pad Pitch |
- |
Function |
Bondability Check |
Bump Size |
- |
Bump Height |
- |
Number of Pad |
- |
Number of Chip |
- |
Polyimide (Option) |
- |
Evaluation KIT |
- |
|
|
Specification |
LCD30-0101JY |
Wafer Size |
φ 6 inch |
Wafer Thickness |
550±25µm |
Chip Size |
15.1 mm × 1.6 mm |
Pad Pitch |
30µm |
Function |
Daisy Chian |
Bump Size |
20µm×100µm |
Bump Height |
any |
Number of Pad |
726 pads/chip |
Number of Chip |
530 chips/wafer |
Polyimide (Option) |
○ |
Evaluation KIT |
WALTS-KIT LCD30_ITO
WALTS-KIT COF30 |
|
- KIT産品一覧表
-
|
Specification |
WALTS-KIT MB50-0102JY_NCR
*NCR: Non Center Solder Resist |
Solder Resist Under Chip |
MB50-0101JY_NCR |
Structure |
1-2-1 Build up Substrate |
Layer Structure |
Layer1 Signal Layer (no Via)
Layer2~Layer4 Mesh |
Outline |
17.0mm×17.0mm×t(0.8mm~1.0mm) |
Core Material |
Core: E-679FGR
Build Layer: ABF-GX13 |
Solder Resist Material |
PSR4000 AUS-703 |
Lead Min L/S |
20µm/30µm |
Number of Lead |
536 |
Pad Dimensions |
φ0.8µm (SR opening: φ0.65µm) |
Number of Measurement Pad |
32 pads |
Electrode |
Electroless Ni/Au plating |
|
|
Specification |
WALTS-KIT MB50-0104JY_CR
WALTS-KIT MB50-0105JY_CR
*CR: Center Solder Resist |
Solder Resist Under Chip |
MB50-0101JY_CR |
Structure |
1-2-1 Build up Substrate |
Layer Structure |
Layer1 Signal Layer (no Via)
Layer2~Layer4 Mesh |
Outline |
17.0mm×17.0mm×t(0.8mm~1.0mm) |
Core Material |
WALTS-KIT MB50-0104JY_CR
Core: E-679FGR
Build Layer: ABF-SH9K
WALTS-KIT MB50-0105JY_CR
Core: E-679FGR
Build Layer: ABF-GX13 |
Solder Resist Material |
WALTS-KIT MB50-0104JY_CR
PFR800AUS-410
WALTS-KIT MB50-0105JY_CR
PSR4000 AUS-703 |
Lead Min L/S |
20µm/30µm |
Number of Lead |
536 |
Pad Dimensions |
φ0.8µm (SR opening: φ0.65µm) |
Number of Measurement Pad |
32 pads |
Electrode |
WALTS-KIT MB50-0104JY_CR
Electroless Ni/Au plating
WALTS-KIT MB50-0105JY_CR
Electroless Ni/Au plating
Cu + OSP
Cu (option: Solder Coat / Sn Coat)
*OSP: Organic Solderability Preservatives |
|
|
Specification |
WALTS-KIT MB50-0102JY_NCR【MAP】
*NCR: Non Center Solder Resist |
Solder Resist Under Chip |
MB50-0102JY_NCR |
Structure |
1-2-1 Build up Substrate |
Layer Structure |
Layer1 Signal Layer (no Via)
Layer2~Layer4 Mesh |
Outline |
187.5mm×64.0mm×t(0.36mm) |
Core Material |
Core: E-679FGBS
Build Layer: GX-13 |
Solder Resist Material |
PFR800 AUS-410 |
Lead Min L/S |
20µm/30µm |
Number of Lead |
536 |
Pad Dimensions |
φ0.8µm (SR opening: φ0.65µm) |
Number of Measurement Pad |
32 pads |
Electrode |
Electroless Ni/Au plating
Cu+OSP |
|
|
Specification |
WALTS-KIT MB50-0103JY_CR【MAP】
WALTS-KIT MB50-0104JY_CR【MAP】
*CR: Center Solder Resist |
Solder Resist Under Chip |
MB50-0103JY_CR, MB50-0104JY_CR |
Structure |
1-2-1 Build up Substrate |
Layer Structure |
Layer1 Signal Layer (no Via)
Layer2~Layer4 Mesh |
Outline |
187.5mm×64.0mm×t(0.36mm) |
Core Material |
Core: E-679FGBS
Build Layer: ABF-GX92 |
Solder Resist Material |
PSR4000 AUS-703 |
Lead Min L/S |
20µm/30µm |
Number of Lead |
536 |
Pad Dimensions |
φ0.8µm (SR opening: φ0.65µm) |
Number of Measurement Pad |
32 pads |
Electrode |
WALTS-KIT MB50-0103JY_CR【MAP】
Electroless Ni/Au plating
Cu + OSP
Cu (option: Solder Coat / Sn Coat)
WALTS-KIT MB50-0104JY_CR【MAP】
Electro Sn plating
*OSP: Organic Solderability Preservatives |
|
WALTS-TEG IP40-0101JY *Silicon Interposer
|
Specification |
WALTS-TEG IP40-0101JY
*Silicon Interposer
[for WALTS-TEG CC40-0101JY] |
Wafer Size |
φ 8 inch |
Wafer Thickness |
725±25µm |
Chip Size |
10.0 mm■ |
Pad Pitch |
(1) 40µm pitch Full area + Staggered (Model Ⅰ)
40µm pitch Staggered (Model Ⅱ)
(2)250µm pitch Periphera (Outer Pad) |
Function |
Daisy Chian
Bump Short Check
Vernier
Breakdown Voltage Check between the Bumps |
Bump Size |
- |
Bump Height |
- |
Number of Pad |
Model Ⅰ
(1) 29576 pads/chip
(2) 124 pads/chip (Outer Pad)
Model Ⅱ
(1) 1352 pads/chip
(2) 124 pads/chip (Outer Pad) |
Number of Chip |
228 chips/wafer |
Polyimide (Option) |
- |
|
WALTS-TEG IP40A-0101JY *Silicon Interposer
|
Specification |
WALTS-TEG IP40A-0101JY
*Silicon Interposer
[for WALTS-TEG CC40-0101JY] |
Wafer Size |
φ 8 inch |
Wafer Thickness |
725±25µm |
Chip Size |
10.0 mm■ |
Pad Pitch |
(1) 40µm pitch Full area + Staggered
(2)250µm pitch Periphera (Outer Pad) |
Function |
Daisy Chian
Bump Short Check
Vernier
Breakdown Voltage Check between the Bumps |
Bump Size |
- |
Bump Height |
- |
Number of Pad |
(1) 29576 pads/chip
(2) 124 pads/chip (Outer Pad) |
Number of Chip |
616 chips/wafer |
Polyimide (Option) |
- |
|
WALTS-TEG IP80-0101JY *Silicon Interposer
|
Specification |
WALTS-TEG IP80-0101JY
*Silicon Interposer
[for WALTS-TEG CC80-0101JY] |
Wafer Size |
φ 8 inch |
Wafer Thickness |
725±25µm |
Chip Size |
10.0 mm■ |
Pad Pitch |
(1) 80µm Staggered (Inner Pad)
(2) 300µm Full Area (Center Core)
(3) 250µm Periphera (Outer Pad) |
Function |
Daisy Chian |
Bump Size |
- |
Bump Height |
- |
Number of Pad |
(1) 648 pads/chip
(2) 400 pads/chip
(3) 124 pads/chip |
Number of Chip |
228 chips/wafer |
Polyimide (Option) |
○ |
|
|
Specification |
WALTS-KIT CC80-0104JY【MAP】
(Type A / Type B) |
Structure |
1-2-1 Build up Substrate |
Layer Structure |
Layer 1, 2 Signal Layer(Via)
Layer 3, 4 Mesh |
Outline |
Type A: 187.5mm×64.0mm×t(0.36mm)
Type B: 187.5mm×64.0mm×t(0.35mm) |
Core Material |
Core: E-679FGBS
Build Layer: GX-92 |
Solder Resist Material |
Type A: PSR4000 AUS-703
Type B: PSR4000 AUS-320 |
Lead Min L/S |
32µm/48uµm |
Number of Lead |
648 |
Pad Dimensions |
φ0.75mm (SR opening: φ0.67mm) |
Number of Measurement Pad |
72 pads |
Electrode |
Electroless Ni/Au Plating
Cu
Cu + OSP
*OSP: Organic Solderability Preservatives |
|
|
Specification |
WALTS-KIT CC80-0104JY_NCR【MAP】 |
Structure |
1-2-1 Build up Substrate |
Layer Structure |
Layer 1, 2 Signal Layer(Via)
Layer 3, 4 Mesh |
Outline |
Type A: 187.5mm×64.0mm×t(0.36mm)
Type B: 187.5mm×64.0mm×t(0.35mm) |
Core Material |
Core: E-679FGBS
Build Layer: GX-92 |
Solder Resist Material |
Type A: PSR4000 AUS-703
Type B: PSR4000 AUS-320 |
Lead Min L/S |
32µm/48µm |
Number of Lead |
648 |
Pad Dimensions |
φ0.75mm (SR opening: φ0.67mm) |
Number of Measurement Pad |
72 pads |
Electrode |
Electroless Ni/Au Plating
Cu
Cu + OSP
*OSP: Organic Solderability Preservatives |
|
|
Specification |
WALTS-KIT CC80-FR2【MAP】ModelⅠ |
Structure |
1-2-1 Build up Substrate |
Layer Structure |
Layer 1, 2 Signal Layer(Via)
Layer 3, 4 Mesh |
Outline |
187.5mm×64.0mm×t(0.35mm) |
Core Material |
Core: E-679FGBS
Build Layer: GX-92 |
Solder Resist Material |
PSR800 AUS-410 |
Solder Resist thickness above Cu metal |
10µm |
Lead Min L/S |
32µm/48µm |
Number of Lead |
Peripheral: 648
Full Area: 400 |
Pad Dimensions |
φ0.75mm (SR opening: φ0.67mm) |
Number of Measurement Pad |
72 pads |
Electrode |
Cu + OSP
*OSP: Organic Solderability Preservatives |
|
|
Specification |
WALTS-KIT CC80MarkⅡ-0201JY【MAP】 |
Structure |
1-2-1 Build up Substrate |
Layer Structure |
Layer 1, 2 Signal Layer(Via)
Layer 3, 4 Mesh |
Outline |
230.0mm×62.5mm×t(0.36mm) |
Core Material |
Core:HL832NSFLC (0.2mmt)
Build Layer: ABF-GX13 |
Solder Resist Material |
PSR800 AUS-410 |
Lead Min L/S |
16µm/24µm |
Number of Electrode |
1660 (Peripheral)
2916 (Center Core) |
Pad Dimensions |
[Square]
0.70mm×0.48mm
(SR opening: 0.62mm×0.40mm)
[Dome]
0.71mm×0.48mm
(SR opening: 0.63mm×0.40mm) |
Number of Measurement Pad |
[Square]68 pads
[Dome]8 pads |
Electrode |
Cu
Cu + OSP
*OSP: Organic Solderability Preservatives |
|
|
Specification |
WALTS-KIT FC150LC-0302JY |
Layer Structure |
2-2-2 |
Outline |
55.0mm×55.0mm×t(0.634mm) |
Core Material |
Core: E-705G |
Solder Resist |
PSR4000 AUS-703 |
Land Size |
φ0.13mm |
Number of Lead |
25921 (161×161) |
SR Opening |
φ90µm |
Number of Measurement Pad |
240 pads |
Daisy Pattern |
(1) Daisy Chain Pattern A: 196 Pads(14×14)
(2) Daisy Chain Pattern B: 72 Pads(12×6)
(3) Daisy Chain Pattern C: 169 Pads(13×13)
(4) Daisy Pattern D: 12 Pads(4×3) |
Electrode |
Cu
Cu+OSP
Electroless Plating: Ni/Pd/Au
Electroless Plating: Ni/Pd/Au+SnAgCu
Electro Plating: Sn etc. |
|
|
Specification |
WALTS-KIT 01A150P-10-2 1×1 |
Structure |
Rigid Substrate (Both) |
Outline |
30.0mm×30.0mm×t(0.96mm) |
Core Material |
Core: E-679FGR |
Solder Resist |
PSR4000 AUS-703 |
Land Size |
φ0.12mm |
Number of Lead |
3721 (61×61) |
SR Opening |
φ80uµm |
Number of Measurement Pad |
24 pads |
Daisy Chain |
Center Area 16×15 Matrix
Corner Area 15×15 four Matrix |
Electrode |
Electroless Ni/Au Plating
Cu + OSP (option Solder Coat)
*OSP: Organic Solderability Preservatives |
|
|
Specification |
WALTS-KIT FC150-0104JY 2×2(E-700G) |
Structure |
Rigid Substrate (Both) |
Outline |
35.0mm×35.0mm×t(0.96mm) |
Core Material |
Core: E-700G |
Solder Resist |
PSR4000 AUS-703 |
Land Size |
φ0.12mm |
Number of Lead |
14884 (3721/chip×4) |
SR Opening |
φ80µm |
Number of Measurement Pad |
32 pads |
Daisy Chain |
Center Area 30×30 Matrix
Corner Area 15×15 four Matrix |
Electrode |
Electroless Ni/Au Plating
NiPdAu+SAC
Cu + OSP (option Solder Coat)
*OSP: Organic Solderability Preservatives |
|
|
Specification |
WALTS-KIT FC150-0103JY 2×2(E-705G) |
Structure |
Rigid Substrate (Both) |
Outline |
35.0mm×35.0mm×t(0.36mm) |
Core Material |
Core: E-705G |
Solder Resist |
PSR4000 AUS-703 |
Land Size |
φ0.12mm |
Number of Lead |
14884 (3721/chip×4) |
SR Opening |
φ80µm |
Number of Measurement Pad |
32 pads |
Daisy Chain |
Center Area 30×30 Matrix
Corner Area 15×15 four Matrix |
Electrode |
NiPdAu+SAC |
|
|
Specification |
WALTS-KIT FC150R-0102JY 2×2 |
Structure |
Rigid Substrate (Both) |
Outline |
35.0mm×35.0mm×t(0.96mm) |
Core Material |
Core: E-700G |
Solder Resist |
PSR4000 AUS-703 |
Land Size |
φ0.12mm |
Number of Lead |
14884 (3721/chip×4) |
SR Opening |
φ80µm |
Number of Measurement Pad |
32 pads |
Daisy Chain |
Center Area 30×30 Matrix
Corner Area 15×15 four Matrix |
Electrode |
Cu
Cu+OSP
Electroless Plating:
Ni/Pd/Au Plating
NiPdAu+SAC
Cu + SAC
*OSP: Organic Solderability Preservatives |
|
|
Specification |
WALTS-KIT 01A200P-10 1×1 |
Structure |
Rigid Substrate (Both) |
Outline |
35.0mm×35.0mm×t(0.86mm) |
Core Material |
Core: E-679FGR |
Solder Resist |
PSR4000 AUS-703 |
Land Size |
φ0.14mm |
Number of Lead |
2116 (46×46) |
Vehicle |
10mm×10mm 200um pitch area |
SR Opening |
φ95µm |
Number of Measurement Pad |
24 pads |
Daisy Chain |
Center Area 12×12 Matrix
Corner Area 12×11 four Matrix |
Electrode |
Electroless Ni/Au Plating
Cu
Cu + OSP (option Solder Coat)
*OSP: Organic Solderability Preservatives |
|
|
Specification |
WALTS-KIT 01A200P-10_C400 1×1 |
Structure |
Rigid Substrate (Both) |
Outline |
35.0mm×35.0mm×t(0.46mm) |
Core Material |
Core: E-679FGR |
Solder Resist |
PSR4000 AUS-703 |
Land Size |
φ0.14mm |
Number of Lead |
2116 (46×46) |
Vehicle |
10mm×10mm 200µm pitch area |
SR Opening |
φ95µm |
Number of Measurement Pad |
24 pads |
Daisy Chain |
Center Area 12×12 Matrix
Corner Area 12×11 four Matrix |
Electrode |
SnAgCu |
|
|
Specification |
WALTS-KIT FC200-0101JY 2×2
WALTS-KIT FC200-0102JY 2×2 |
Structure |
Rigid Substrate (Both) |
Outline |
35.0mm×35.0mm×t(0.87mm) |
Core Material |
WALTS-KIT FC200-0101JY 2×2
Core: E-679FGR
WALTS-KIT FC200-0102JY 2×2
Core: E-700GR |
Solder Resist |
PSR4000 AUS-703 |
Land Size |
φ0.14mm |
Number of Lead |
8464 (2116/chip×4) |
Vehicle |
20mm×20mm 200µm pitch area |
SR Opening |
φ95µm |
Number of Measurement Pad |
32 pads |
Daisy Chain |
Center Area 20×18 Matrix
Corner Area 12×11 four Matrix |
Electrode |
Electroless Ni/Au Plating
Cu + OSP (option Solder Coat)
*OSP: Organic Solderability Preservatives |
|
|
Specification |
WALTS-KIT FC200-0101JY 2×2
|
Structure |
Rigid Substrate (Both) |
Outline |
35.0mm×35.0mm×t(1.05mm) |
Core Material |
Core: E-700G |
Solder Resist |
PSR4000 AUS-703 |
Land Size |
φ0.14mm |
Number of Lead |
2904 (484/chip×6) |
Vehicle |
10.04mm×15.06mm 200µm pitch area |
SR Opening |
φ95µm |
Number of Measurement Pad |
64 pads |
Daisy Chain |
Center Area 8×10 two Matrix
Corner Area 12×11 four Matrix
Out Side Area 7×12 two Matrix |
Electrode |
Electroless Sn Plating
Cu + OSP (option Solder Coat)
*OSP: Organic Solderability Preservatives |
|
|
Specification |
WALTS-KIT FC200-0101JY 3×3 |
Structure |
Rigid Substrate (Both) |
Outline |
35.0mm×35.0mm×t(1.05mm) |
Core Material |
Core: E-700G |
Solder Resist |
PSR4000 AUS-703 |
Land Size |
φ0.14mm |
Number of Lead |
2904 (484/chip×6) |
Vehicle |
10.04mm×15.06mm 200µm pitch area |
SR Opening |
φ95µm |
Number of Measurement Pad |
64 pads |
Daisy Chain |
Center Area 8×10 two Matrix
Corner Area 12×11 four Matrix
Out Side Area 7×12 two Matrix |
Electrode |
Electroless Sn Plating
Cu + OSP (option Solder Coat)
*OSP: Organic Solderability Preservatives |
|
|
Specification |
WALTS-KIT WLP300P/400P
* for WLP TEG (0.4mm pitch & 0.3mm pitch) |
Structure |
1-0-1 Build up Substrate |
Layer Structure |
Layer1, Layer2 |
Outline |
30.0mm×30.0mm×t(0.93mm) |
Core Material |
Core: E-679FGR
Build Layer: ABF-GX13 |
Solder Resist |
PSR4000 AUS-703 |
Number of Lead |
WLP300P: 264
WLP400P: 144 |
Pad Dimensions |
2.4mm×4.0mm
(SR opening: 2.2mm×3.8mm) |
Number of Measurement Pad |
15 pads |
Electrode |
Electroless Ni/Au plating |
|
|
Specification |
WALTS-KIT EM0101JY |
Outline |
250.0mm×90.0mm×t(1.53mm) |
Core Material |
Core: E-679GT |
Solder Resist |
PSR4000 AUS-703 |
Lead Min L/S |
①L/S=40µm/15µm
②L/S=40µm/20µm
③L/S=40µm/30µm
④L/S=40µm/40µm
⑤L/S=40µm/50µm |
|
|
Specification |
WALTS-KIT STAC-0201JY |
Structure |
Rigid Substrate (Both) |
Outline |
45.0mm×45.0mm×t(0.55mm) |
Core Material |
Core: E-705G |
Solder Resist |
PSR4000 AUS-703 |
FCA Area |
Pad Pitch: 300µm
SR Opening: φ110µm
・Top Side: for 1×1 chip, 3×3 chip
・Bottom Side: for 2×2 chip, 4×4chip |
Electrode |
Cu
Cu + OSP
Ni/Au
Ni/Pd/Au+SnAgCu
*OSP: Organic Solderability Preservatives |
|
|
Specification |
WALTS-COF TEG-KIT001 |
Core Material |
S'PERFLEC-S Grade (KAPTON)
S'PERFLEC-US Grade (ESPANEX) |
Composition |
Polyimide: KAPTON (38µm), ESPANEX(34µm)
Cu: Sputtered 8µm |
Solder Resist |
- |
Plating Material |
Sn (0.2±0.05) |
Lead Pitch |
①12.5µm/12.5µm
②15.0µm/10.0µm
③10.0µm/15.0µm
④10.0µm/10.0µm |
Pad Dimensions |
3.0mm×1.5mm |
|
|
Specification |
WALTS-KIT LCD30-0101JY |
Material |
Non Alkali Glass |
Outline |
52.55mm×24.00mm×t(0.70mm) |
Wire Material |
ITO 1,500Å (option IZO) |
Function |
Daisy Chain
Breakdown Voltage Check between the Bumps |
Conformed Chip |
WALTS-TEG LCD30-0101JY |
|
|
Specification |
WALTS-KIT LCD30-0102JY |
Material |
Non Alkali Glass |
Outline |
52.55mm×24.00mm×t(0.70mm) |
Wire Material |
Al-Nd (150nm) |
Function |
Daisy Chain
Breakdown Voltage Check between the Bumps |
Leed Protection Film |
SiN |
Conformed Chip |
WALTS-TEG LCD30-0101JY |
|
WALTS-KIT COF30-0101JY
|
|
SIPOS-TEG 製品詳細
SIPOS-TEG SB04【Periphral & Staggered】
Specification |
SB0401
 |
SB0402
 |
SB0403
 |
SB0404
 |
Wafer Size |
φ 8 inch |
Wafer Thickness |
725um±25µm |
Chip Size |
3.0mm■ |
3.0mm■ |
3.0mm■ |
3.0mm■ |
Pad Pitch |
60um Periphral |
80um Periphral |
100um Periphral |
300um Staggered |
Number of Pad |
168pad |
120pad |
96pad |
256pad |
Pad Size |
46µm■ |
60µm■ |
80µm■ |
32µm■ |
Pad Opening Size |
40µm■ |
50µm■ |
70µm■ |
26µm■ |
Scribe Width |
100µm |
100µm |
100µm |
100µm |
Comb Dimension |
L/S = 7µm/7µm |
L/S = 10µm/10µm |
L/S = 12µm/12µm |
L/S = 5µm/5µm |
Number of Comb |
70 (35×2) |
50 (25×2) |
40 (20×2) |
100 (50×2) |
Interlayer
Dielectric Patter |
φ1.0mm (Octagon) |
φ1.0mm (Octagon) |
φ1.0mm (Octagon) |
φ1.0mm (Octagon) |
SIPOS-TEG SB05/06【Full Area】
Specification |
SB0501 |
SB0502
 |
SB0601
 |
SB0602
 |
Wafer Size |
φ 8 inch |
Wafer Thickness |
725um±25µm |
Chip Size |
3.0mm■ |
3.0mm■ |
3.0mm■ |
3.0mm■ |
Pad Pitch |
150µm |
300µm |
150µm |
300µm |
Number of Pad |
324pad |
64pad |
68pad |
32pad |
Daisy Chain Pad |
180pad |
32pad |
- |
- |
Pad Size |
100µm■ |
190µm■ |
100µm■ |
190um■ |
Pad Opening |
φ90µm |
φ180µm |
φ100µm |
φ180µm |
Scribe Width |
100µm |
100um |
100µm |
100µm |
Comb Dimension |
- |
- |
L/S = 18µm/18µm |
L/S = 36µm/36µm |
Number of Comb |
- |
- |
28 (14×2) |
14 (7×2) |
Interlayer
Dielectric Patter |
- |
- |
φ1.0mm (Octagon) |
φ1.0mm (Octagon) |
SIPOS-TEG TEST-9【TSV】
Specification |
A
 |
B
 |
C
 |
D
|
Wafer Size |
φ 8 inch |
Wafer Thickness |
725um±25µm |
Chip Size |
20.0mm■ |
20.0mm■ |
20.0mm■ |
20.0mm■ |
TSV Hole Diameter |
20µm● 20µm■ |
30µm● 30µm■ |
50µm● 50µm■ |
80µm● 80µm■ |
TSV Pitch (X) |
80µm |
120µm |
150µm |
200µm |
TSV Pitch (Y) |
40µm, 50µm, 60µm |
60µm, 80µm, 100µm |
80µm, 100µm, 120µm |
120µm, 150µm, 220µm |
WALTS將依據客戶各種技術開發的需求,有效率的提供鍍膜、晶圓研磨、晶圓切割及柱型金凸塊加工等服務,致力於協助封裝技術的研究開發。